The plastic forming properties of metal depend on the nature of the metal and on the deformation conditions. However, in the process of grating mechanical scribing, the flow of materials, the distribution of stress and strain fields, and the tool loading can be hardly detected and controlled. In order to obtain a better groove shape and ensure the quality of the grating geometry, the metal flow inside the material during the scratching process was studied. The equivalent strain map, stress distribution, and metal flow rate of the scratching process can be clearly obtained from the simulation results of the grating scribe, and the flow law of the metal material can be grasped. By analyzing the equivalent strain map and stress distribution of the grating scribing process, the force distribution and size of the aluminum film are obtained, which is reflected in the stress of each side of the extended pyramid knife and each blade.To provide the theoretical basis and test data for the design of diamond-like tool design and its process, so as to improve the design quality and efficiency of the tool and provide scientific basis for the orientation and development of such diamond scribe tool.
Keywords: Metal flow, plane plastic flow, DEFORM-3D, equivalent stress distribution
As a wide band gap semiconductor material silicon carbide, with a stable chemical properties and good thermal conductivity of physical properties, in addition to the mechanical properties of the material also has a strong advantage. In order to explore more scientific and practical nanomaterials, this paper studies the preparation process of silicon carbide nanomaterials and the optical characterization of the materials, and analyzes the properties of the materials, 3C-SiC nanowires and 3C-SiC micron polyhedra, XRD patterns, infrared spectra, Raman spectra, thermogravimetric curves and room temperature photoluminescence spectra. By studying the experimental results of optical properties, it is concluded that silicon carbide products have great application prospect in optoelectronic devices.
Keywords: Optical testing, silicon carbide nanostructures, XRD diffraction pattern,infrared spectrogram